PRODUCTS
ELECTRICAL TEST ENGENEERING

PRODUCTS
ELECTRICAL TEST ENGENEERING

Test circuitry by Systec

SYSTEC test racks are based on the revolutionary National Instruments single-board realtime IO architecture and are therefore fully programmable in LabVIEW.The matrix switch units of the newly developed test circuits are universally parameterizable and cover many application profiles. Key elements (besides the backplane adapted to customer requirements) include the highly-integrated switching module in DIMM format. All modules have a dedicated microcontroller that is directly connected via a two-wire link (I2C) to ports of the FPGA element in the single-board RIO module. The microcontrollers (optionally) control 80 PhotoMOS relays.

The multiplexer modules, controlled by microcontrollers and composed of DIMM modules, feature outstanding characteristics in respect of extendibility, response times, switching times, maintainability, calibratability, robustness and value for money. These modules can be easily plugged into the newly developed backplanes. Highly scalable matrix switches for measurement technology can be achieved by combining the modules with the SB-RIO system.

Advantages of test circuit:

 

maximum reliability (>1015 cycles)

extremely small footprint

very large number of channels

high level of complexity

lowest switching times

optimal response times

excellent value for money

best maintainability (replacement within 5 seconds, due to DIMM technology)

extremely robust and shock-resistant

excellent scalability

small form factor (SMT)

realtime / FPGA system (no virus attack possible)

short conductor lengths, high immunity to interference, excellent maintainability

self-calibrating system using voltage and current standards (calibrated via central 6.5-digitsystem multimeter)

self-aligning subsystem (storage of support points and algorithms in flash memory)

universally configurable system

redundancies

high-performance processes

strong reduction in host computer load

optimal MTBF values

replacement components precalibrated and usable for all variants

extendibility, matrix switch options

current and voltage standards integrated

usable for next-generation test specimens

Test circuitry by Systec

SYSTEC test racks are based on the revolutionary National Instruments single-board realtime IO architecture and are therefore fully programmable in LabVIEW.The matrix switch units of the newly developed test circuits are universally parameterizable and cover many application profiles. Key elements (besides the backplane adapted to customer requirements) include the highly-integrated switching module in DIMM format. All modules have a dedicated microcontroller that is directly connected via a two-wire link (I2C) to ports of the FPGA element in the single-board RIO module. The microcontrollers (optionally) control 80 PhotoMOS relays.

The multiplexer modules, controlled by microcontrollers and composed of DIMM modules, feature outstanding characteristics in respect of extendibility, response times, switching times, maintainability, calibratability, robustness and value for money. These modules can be easily plugged into the newly developed backplanes. Highly scalable matrix switches for measurement technology can be achieved by combining the modules with the SB-RIO system.

Advantages of test circuit:

 

maximum reliability (>1015 cycles)

extremely small footprint

very large number of channels

high level of complexity

lowest switching times

optimal response times

excellent value for money

best maintainability (replacement within 5 seconds, due to DIMM technology)

extremely robust and shock-resistant

excellent scalability

small form factor (SMT)

realtime / FPGA system (no virus attack possible)

short conductor lengths, high immunity to interference, excellent maintainability

self-calibrating system using voltage and current standards (calibrated via central 6.5-digitsystem multimeter)

self-aligning subsystem (storage of support points and algorithms in flash memory)

universally configurable system

redundancies

high-performance processes

strong reduction in host computer load

optimal MTBF values

replacement components precalibrated and usable for all variants

extendibility, matrix switch options

current and voltage standards integrated

usable for next-generation test specimens

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